INTERFACE THAT SIGNIFICANTLY INCREASES THE DESIGN FOR TEST (DFT) AND DEBUG CAPABILITIES OF THE SCHEMATIC CAPTURE AND PCB DESIGN SYSTEM

Topic: INTERFACE THAT SIGNIFICANTLY INCREASES THE DESIGN FOR TEST (DFT) AND DEBUG CAPABILITIES OF THE SCHEMATIC CAPTURE AND PCB DESIGN SYSTEM
Support media: Press Release
Project type: Translation English to Italian
Focus area: Electronics & semiconductors
Customer country: IRELAND (EU)

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